RME ADI-8 Pro DS and LynxTWO

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Full duplex 1 kHz Distortion and Noise (-15 dbFS Input Level):

ADI-8

Trade Dynamic Range for Distortion:

ADI-8

Here, the signal level was reduced by 8 dB. The 2nd harmonic level is reduced to -111 dB, corrected for level (other distortion products are reduced, as well). Limiting the signal level reduces the dynamic range but improves the distortion in greater measure.

Jitter, full duplex:

ADI-8

Measurement conditions (ADI-8 Pro DS):

Computer: 500 MHz G3 PowerBook (FireWire / Pismo / 2000), 256 MB RAM.
Measurement software: Mac the Scope, 2048 point (X2) FFT, Square window function, linear frequency axis.
Stimulus signal was generated by Mac the Scope / Waavebox. Signal: 1 kHz / 12 kHz, DIGITAL LOCK enabled, 1024 sample latency (e.g., sequence length).
Measurements were made at 48 kHz sample rate, 24/32 bit, 8 channel i / o. Channel 1 is shown, and represents other channels.
Connections were made via the ADI-8's DB-25 jacks via a ProCo 8 channel DB25 to DB25 snake (inputs and outputs connected together).
DigiFace CardBus / PCMCIA interface between PowerBook and ADI-8
Plot range is -160 dB to 0 dBFS.

Measurement conditions (LynxTWO PCI card):

Computer: 500 MHz G4
Measurement software: Mac the Scope, 2048 point (X2) FFT, Square window function, linear frequency axis.
Stimulus signal was generated by Mac the Scope / Waavebox. Signal: 1 kHz, DIGITAL LOCK enabled, 1024 sample latency (e.g., sequence length).
Measurements were made at 44.1 kHz sample rate, 24/32 bit, 8 channel i / o. Channel 1 is shown, and represents other channels.
Connections were made via the supplied breakout cable (inputs and outputs connected together).
Plot range is -160 dB to 0 dBFS.
These measurements will be updated and expanded when the final release ASIO driver is available.

Note: the distortion measurements may be replicated with the free, demo version of Mac the Scope (the session timeout limit provides ample time for making the measurement).

Here are links to some other measurements.
Here is a procedure for making the distortion measurement.

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